MIL-HDBK-704-3
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来源:标准资料网
MIL-HDBK-704-3, DEPARTMENT OF DEFENSE HANDBOOK: GUIDANCE FOR TEST PROCEDURES FOR DEMONSTRATION OF UTILIZATION EQUIPMENT COMPLIANCE TO AIRCRAFT ELECTRICAL POWER CHARACTERISTICS THREE PHASE, 400 Hz, 115 VOLT (PART 3 OF 8 PARTS) (9 APR 2004)., This handbook provides guidance on test procedures for demonstration of three phase, 400 Hz, 115 volt utilization equipment to determine compliance with the applicable edition of MIL-STD-704. MIL-HDBK-704-3 is Part 3 in a series of 8 Parts. Part 3 describes the test methods and procedures to demonstrate that three phase, 400 Hz, 115 volt utilization equipment is compatible with the electric power characteristics of MIL-STD-704. These series of handbooks and MIL-STD-704 are companion documents.
Product Code:SAE ARP582
Title:Lighting, Integral, For Aircraft Instruments: Criteria for Design of Red Incandescent Lighted Instruments (NONCURRENT Aug 2006)
Issuing Committee:A-20ac Crew Station And Interior Lighting Committee
Scope:This SAE Aerospace Recommended Practice (ARP) covers the general requirements and test procedures for illuminating systems for integrally lighted aircraft instruments in order to provide (a) uniformity of illumination within each instrument, (b) legibility of instrument presentation under daylight or integral light, and (c) uniformity of illumination between instrument displays.【英文标准名称】:Discretesemiconductordevicesandintegratedcircuits-Part5-3:Optoelectronicdevices;Measuringmethods(IEC60747-5-3:1997+A1:2002);GermanversionEN60747-5-3:2001+A1:2002
【原文标准名称】:半导体分立器件和集成电路.第5-3部分:光电器件.测量方法(IEC60747-5-3:1997+A1:2002);德文版本EN60747-5-3:2001+A1:2002
【标准号】:DINEN60747-5-3-2003
【标准状态】:现行
【国别】:德国
【发布日期】:2003-01-01
【实施或试行日期】:2003-01-01
【发布单位】:德国标准化学会(DE-DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:光耦合器;辐射强度;半导体器件;二极管;显示装置;光电二极管;分立器件;绝缘测试;光电子器件;频带宽度;绝缘电阻;电子设备及元件;发光强度;试验;暗电流;测量技术;电性质和电现象;集成电路
【英文主题词】:Bandwidths;Darkcurrent;Diodes;Discretedevices;Displaydevices;Electricalpropertiesandphenomena;Electronicequipmentandcomponents;Insulatingresistance;Insulationtest;Integratedcircuits;Luminousintensity;Measuringtechniques;Optoelectronicdevices;Photocouplers;Photodiodes;Radiantintensity;Semiconductordevices;Testing
【摘要】:
【中国标准分类号】:L56
【国际标准分类号】:31_260
【页数】:45P.;A4
【正文语种】:德语
